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| Products > Vision Inspection |
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‘BEE EYE’
Vision Inspection System
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| IN HOUSE DEVELOPED VISION SYSTEM FOR WAFER AND DIE INSPECTION. OFF LINE INSPECTION AND CUSTOMIZATION ARE AVAILABLE. |
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Die size measurement |
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Die surface contamination, probe mark and ink dot inspection |
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Die corner chipping and cracking inspection |
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Die missing, unexpected pitching detection |
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Flip Chip solder bump diameter, pitch measurement |
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| Please contact us for more information……. |
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